Published August 15, 1995 | Version v1
Patent Open

Combined expert system/neural networks method for process fault diagnosis

  • 1. Argonne National Laboratory

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Description

A two-level hierarchical approach for process fault diagnosis is an operating system employs a function-oriented approach at a first level and a component characteristic-oriented approach at a second level, where the decision-making procedure is structured in order of decreasing intelligence with increasing precision. At the first level, the diagnostic method is general and has knowledge of the overall process including a wide variety of plant transients and the functional behavior of the process components. An expert system classifies malfunctions by function to narrow the diagnostic focus to a particular set of possible faulty components that could be responsible for the detected functional misbehavior of the operating system. At the second level, the diagnostic method limits its scope to component malfunctions, using more detailed knowledge of component characteristics. Trained artificial neural networks are used to further narrow the diagnosis and to uniquely identify the faulty component by classifying the abnormal condition data as a failure of one of the hypothesized components through component characteristics. Once an anomaly is detected, the hierarchical structure is used to successively narrow the diagnostic focus from a function misbehavior, i.e., a function oriented approach, until the fault can be determined, i.e., a component characteristic-oriented approach.

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Additional details

Identifiers

Patent number
US 13288893 A
Patent application number
US 5442555 A
Other
oai:uchicago.tind.io:9223

Dates

Patent filed
1993-10-07

UChicago Information

Division(s)
Physical Sciences Division
Department(s)
Chemistry, Physics