Centers and Institutes
Published February 8, 2024 | Version v1
Journal article Open

Detection of thin film phase transformations at high-pressure and high-temperature in a diamond anvil cell

Creators

  • 1. University of Hawaii at Manoa
  • 2. Michigan State University
  • 3. University of Michigan
  • 4. University of Chicago

Description

Quantifying how grain size and/or deviatoric stress impact (Mg,Fe)2SiO4 phase stability is critical for advancing our understanding of subduction processes and deep-focus earthquakes. Here, we demonstrate that well-resolved X-ray diffraction patterns can be obtained on nano-grained thin films within laser-heated diamond anvil cells (DACs) at hydrostatic pressures up to 24 GPa and temperatures up to 2300 K. Combined with well-established literature processes for tuning thin film grain size, biaxial stress, and substrate identity, these results suggest that DAC-loaded thin films can be useful for determining how grain size, deviatoric stress, and/or the coexistence of other phases influence high-pressure phase stability. As such, this novel DAC-loaded thin film approach may find use in a variety of earth science, planetary science, solid-state physics, and materials science applications.

Data availability

The dataset used to generate Figs. 2 and 3 can be found at https://doi.org/10.5061/dryad.66t1g1k7x.

Files

Detection-of-thin-film-phase-transformations-at-high-pressure-and-high-temperature-in-a-diamond-anvil-cell.pdf

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Additional details

Identifiers

DOI
10.1038/s43247-024-01234-9
Other
oai:uchicago.tind.io:10935

Funding

National Science Foundation
EAR-2031149
National Science Foundation
EAR-2031331
National Science Foundation
EAR-1829273
National Science Foundation
EAR-2127807
Projekt DEAL

UChicago Information

Division(s)
Physical Sciences Division
Center(s) or Institute(s)
Center for Advanced Radiation Sources