Published January 3, 2008 | Version v1
Patent Open

High resolution x-ray and gamma ray imaging using diffraction lenses with mechanically bent crystals

  • 1. Argonne National Laboratory

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Description

A method for high spatial resolution imaging of a plurality of sources of x-ray and gamma-ray radiation is provided. High quality mechanically bent diffracting crystals of 0.1 mm radial width are used for focusing the radiation and directing the radiation to an array of detectors which is used for analyzing their addition to collect data as to the location of the source of radiation. A computer is used for converting the data to an image. The invention also provides for the use of a multi-component high resolution detector array and for narrow source and detector apertures.

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Additional details

Identifiers

Patent application number
US 47979706 A
Patent number
US 2008/0001096 A1
Other
oai:uchicago.tind.io:9359

Dates

Patent filed
2006-06-30

UChicago Information

Division(s)
Physical Sciences Division
Department(s)
Physics