Published January 3, 2008
| Version v1
Patent
Open
High resolution x-ray and gamma ray imaging using diffraction lenses with mechanically bent crystals
Description
A method for high spatial resolution imaging of a plurality of sources of x-ray and gamma-ray radiation is provided. High quality mechanically bent diffracting crystals of 0.1 mm radial width are used for focusing the radiation and directing the radiation to an array of detectors which is used for analyzing their addition to collect data as to the location of the source of radiation. A computer is used for converting the data to an image. The invention also provides for the use of a multi-component high resolution detector array and for narrow source and detector apertures.
Files
US20080001096.pdf
Files
(908.4 kB)
| Name | Size | Download all |
|---|---|---|
|
md5:9bbc184e5e3eacc976f988f9e174047c
|
908.4 kB | Preview Download |
Additional details
Identifiers
- Patent application number
- US 47979706 A
- Patent number
- US 2008/0001096 A1
- Other
- oai:uchicago.tind.io:9359
Dates
- Patent filed
-
2006-06-30