Published June 15, 2010
| Version v1
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NMR characterization of thin films
Creators
- 1. University of Chicago
Contributors
Patent applicant:
Description
A method, apparatus, and system for characterizing thin film materials. The method, apparatus, and system includes a container for receiving a starting material, applying a gravitational force, a magnetic force, and an electric force or combinations thereof to at least the starting material, forming a thin film material, sensing an NMR signal from the thin film material and analyzing the NMR signal to characterize the thin film of material.
Files
US7737691.pdf
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Additional details
Identifiers
- Patent number
- US 19872408 A
- Patent application number
- US 7737691 B2
- Other
- oai:uchicago.tind.io:6613
Dates
- Patent filed
-
2008-08-26