Published March 24, 2020
| Version v1
Patent
Open
Model checker for finding distributed concurrency bugs
Creators
- 1. University of Chicago
- 2. Futurewei Technologies
Contributors
Patent applicants:
Description
Described herein are systems and methods for distributed concurrency (DC) bug detection. The method includes identifying a plurality of nodes in a distributed computing cluster; identifying a plurality of messages to be transmitted during execution of an application by the distributed computing cluster; determining a set of orderings of the plurality of messages for DC bug detection, the set of orderings determined based upon the plurality of nodes and the plurality of messages; removing a subset of the orderings from the set of orderings based upon one or more of a state symmetry algorithm, a disjoint-update independence algorithm, or a zero-crash-impact reordering algorithm; and performing DC bug detection testing using the set of orderings after the subset of the orderings is removed from the set of orderings.
Files
US10599552.pdf
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Additional details
Identifiers
- Patent number
- US 10599552 B2
- Patent application number
- US 201815962873 A
- Other
- oai:uchicago.tind.io:6963
Dates
- Patent filed
-
2018-04-25