Physical Sciences Division
Published December 2, 2025 | Version v1
Journal article Metadata-only

Photoemission electron microscopy for connectomics

Creators

  • 1. University of Chicago
  • 2. University of Illinois Chicago
  • 3. Okinawa Institute of Science and Technology
  • 4. Leiden University
  • 5. Magnetic Materials Group

Description

Photoemission electron microscopy (PEEM) offers a potential third modality for large-volume connectomics alongside transmission electron microscopy (TEM) and scanning electron microscopy (SEM). We image osmium stained, ultrathin brain sections on gold coated silicon at synaptic resolution using commercial PEEMs. At coarser resolution, we demonstrate that ultraviolet laser illumination enables gigavoxel-per-second acquisition rates without thermal damage. PEEM combines TEM-like parallel detection with SEM-compatible solid supports into a potentially scalable and cost-effective approach for large-volume connectomes.

Data availability

3D image stacks data have been deposited in Webknossos [https://webknossos.org/links/iyQBZLZFmxtDAe8e (9) and https://webknossos.org/links/gMXAns5EtQo89QVU (10)].

Additional details

Identifiers

DOI
10.1073/pnas.2521349122
Other
oai:uchicago.tind.io:16663

Funding

National Institutes of Health
5U01NS136401-02

UChicago Information

Division(s)
Biological Sciences Division, Physical Sciences Division
Department(s)
Biophysical Sciences, Chemistry, Neurobiology
Center(s) or Institute(s)
James Franck Institute