Published June 30, 1998 | Version v1
Patent Open

System for monitoring an industrial or biological process

Description

A method and apparatus for monitoring and responding to conditions of an industrial process. Industrial process signals, such as repetitive manufacturing, testing and operational machine signals, are generated by a system. Sensor signals characteristic of the process are generated over a time length and compared to reference signals over the time length. The industrial signals are adjusted over the time length relative to the reference signals, the phase shift of the industrial signals is optimized to the reference signals and the resulting signals output for analysis by systems such as SPRT.

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Additional details

Identifiers

Patent application number
US 50545395 A
Patent number
US 5774379 A
Other
oai:uchicago.tind.io:8756

Dates

Patent filed
1995-07-21

UChicago Information

Division(s)
Physical Sciences Division
Department(s)
Chemistry