Published December 24, 2020
| Version v1
Patent
Open
Electrometry by Optical Charge Conversion of Defects in the Solid-State
Creators
- 1. University of Chicago
Contributors
Patent applicant:
Description
Methods and systems are disclosed for sensing an environment electric field. In one exemplary implementation, a method includes disposing a sensor in the environment, wherein the sensor comprising a crystalline lattice and at least one optically-active defect in the crystalline lattice; pre-exciting the crystalline lattice to prepare at least one defect in a first charge state using a first optical beam at a first optical wavelength; converting at least one defect from the first charge state to a second charge state using a second optical beam at a second optical wavelength; monitoring a characteristics of photoluminescence emitted from the defect during or after the conversion of the at least one defect from the first charge state to the second charge state; and determining a characteristics of the electric field in the environment according to the monitored characteristics of the photoluminescence.
Files
US20200400723.pdf
Files
(1.5 MB)
| Name | Size | Download all |
|---|---|---|
|
md5:79f3258f094d9c7fe2c4062e5459b0d3
|
1.5 MB | Preview Download |
Additional details
Identifiers
- Patent application number
- US 201916968471 A
- Patent number
- US 2020/0400723 A1
- Other
- oai:uchicago.tind.io:8172
Dates
- Patent filed
-
2019-02-13